2010 UGM Registration Information
2010 DC FIB Users Group Meeting
February 25 - 26, 2010
National Institute of Standards and Technology, Gaithersburg, MD
Registration is now closed!
Registration
There is no registration fee required to attend the meeting. However, NIST is a closed campus and you need to be a registered visitor to attend the meeting.
Please contact us if you would like to attend the meeting. Also let us know whether you are interested in attending the Happy Hour on February 25, 2010.
Technical Contribution
Please contact us if you'd like to present a talk and/or a poster. Technical presentations and posters should focus on interesting scientific and/or engineering applications of FIB and FIB related technology. Talks should be 15 minutes long with additional 5 minutes for Q&A. Maximum poster size should be 40" wide by 60" tall.
AML Tour
NIST's Advanced Measurement Laboratory Tour will include visits to various ion and electron microscopy labs. Tentative tour stops are:
- CNST NanoFab including NVision 40 CrossBeam
- CSTL Microanalysis Labs including Nova NanoLab 600, Titan 80-300 AEM, Quanta 200F ESEM
- MEL Nanoscale Metrology Labs including Helios NanoLab 600, Orion Helium Ion Microscope
Getting to NIST
Building 215 Room C103/106
Advanced Measurement Laboratory
NIST
100 Bureau Drive, Gaithersburg, MD
Please check the NIST visitor site for directions and lodging information.
http://www.nist.gov/public_affairs/visitor/visitor.htm