2010 UGM Agenda
Agenda
February 25 & 26, 2010
National Institute of Standards and Technology
Gaithersburg, MD
February 25 & 26, 2010
National Institute of Standards and Technology
Gaithersburg, MD
Breakfast, Lunch, Coffee Breaks and Happy Hour are sponsored by FEI Company, Bruker AXS, Kleindiek Nanotechnik, Angstrom Scientific, Carl Zeiss SMT, Omniprobe & JEOL.
| Thursday, February 25th, 2010 | |
| 8:30 AM | Breakfast & Coffee |
| 9:00 AM | Welcome |
| Morning |
|
| 9:10 AM | Stephan Kleindiek, Kleindiek Nanotechnik Accelerating sample throughput: The Shuttle Platform for Sample Preparation |
| 9:40 AM | Lynne Gignac, IBM Precision, double XTEM sample preparation of site specific Si nanowires |
| 10:00 AM | Tom Zega, NRL FIB-SEM as an enabling tool for investigating the chemistry of the early solar system and thermodynamics of ancient stars |
| 10:20 AM | Nabil Bassim, NRL Low-Damage Preparation of Carbonaceous Materials Using the Focused Ion Beam |
| 10:40 AM | COFFEE BREAK |
| 11:00 AM | Jing Fu, NIH/NCI Ion abrasion microscopy of biological cells, promises and challenges (Please contact the organizers for the password.) |
| 11:20 AM | Michael Marko, Wadsworth Center Cryo-FIB preparation for TEM cryo-tomography |
| 11:40 AM | Andras Vladar/Bin Ming, NIST Nano-fabrication, nanometer-scale imaging and metrology with the Orion Scanning Helium Ion Microscope |
| Lunch |
|
| 12:00 PM | Lunch |
| Poster Session |
|
| 1:00 PM | Michael Anderson, NIST STEM based structural characterization of layered incommensurate nanocomposites Rocco Cerchiara, Fischione Sample Preparation of Single and Multi-Phase Materials for Aberration-Corrected TEM/STEM Bradley Degregorio, NRL Applications and Advantages of FIB for the Study of Geological and Extraterrestrial Samples Gavin Murphy, NIH/NCI Ion Abrasion SEM: New methodological advances and applications to tissue imaging Mark Twigg, NRL Simulation and analysis of electron channeling contrast images (ECCI) recorded using an FEI 600 dual beam FIB equipped with an Oxford Nordlys EBSD detector John Carpenter, EDAX Focused Ion Beams for 3D and Surface Preparation in EBSD and EDS |
| Afternoon |
|
| 2:20 PM | Alex Buxbaum, FEI New DualBeam Software for 3D Characterization |
| 2:40 PM | Matthew Weschler, JHT Instruments HyperFIB! - Why Everyone Will Have One in 5 Years |
| 3:00 PM | Cheryl Hartfield, Omniprobe Sample repositioning solutions for in situ preparation and analysis |
| 3:20 PM | COFFEE BREAK |
| 3:40 PM | Scott Sitzman, Oxford Instruments 3D EBSD in the FIB-SEM |
| 4:00 PM | Jerry Lehman, Carl Zeiss SMT 3D Reconstruction and Nano Patterning on a Crossbeam Workstation |
| 4:20 PM | Mike Marsh, Visualization Sciences Group Advanced 3D Visualization and Analysis for FIB data with Avizo |
| 4:40 PM | Wrap-up of Day 1 |
| 5:00 PM | Happy Hour at Dogfish Head (across the street from NIST main gate) |
| Friday, February 26th, 2010 | |
| 8:30 AM | Breakfast & Coffee |
| 9:00 AM | Lab tours Tours will include NIST FIBs, Titan AEM, Helium Ion Microscope, CNST NanoFab Facility |
| 10:30 AM | COFFEE BREAK |
| 10:50 AM | Group Discussions 3D visualization of FIB data sets: Tools & Needs |
| 12:00 PM | Adjourn |
Organizers
Keana Scott, National Institute of Standards and Technology
Nabil Bassim, U.S. Naval Research Laboratory
Ken Livi, Johns Hopkins University
Sponsors
