DC Area FIB SEM Users Group
Meetings
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Welcome
2010 SPIE Scanning Microscopy
Abstract deadline is extended till January 15th, 2010.
News
4th Annual Washington DC FIB UGM
Johns Hopkins University
Baltimore, MD
February 25, 2011
New Developments in Microanalytical Techniques for Electron Microscopy
Carnegie Institution of Washington
5251 Broad Branch Road, NW
Washington, DC
June 3, 2010
AMFA 2010
Sheraton Reston Hotel
Reston, VA
May 21, 2010
Electron Backscatter Diffraction 2010
University of Wisconsin, Madison, WI
May 24-26, 2010
2010 SPIE Scanning Microscopy
Abstract deadline is extended till January 15th, 2010.
2010 DC FIB Users Group Meeting
Meet the local FIB users and share your expertise at the 3rd DC Area FIB UGM.