Call for Papers




11th Annual FIB SEM Workshop

Monday, April 30th - Wednesday, May 2nd, 2018
McMaster University
Hamilton (near Toronto), Ontario, Canada

The 2018 FIB SEM Meeting is co-sponsored by Canadian Center for Electron Microscopy (CCEM) and Microscopy Society of Canada, and will be held at McMaster University, Hamilton, Ontario, Canada. It is a bit later in the year (since it’s really cold in Hamilton in February!) but it will be the same informative and fun meeting, just more of it. We will have a full day of FIB tutorials (optional) followed by two days of user and vendor presentations/demos and plenty of opportunities for informal discussion with your fellow FIBers.

  • Abstract Submission Deadline: March 30th, 2018
    Abstracts should be 250 words or less in length. Please email your abstracts to
    Abstract Notification: April 9th, 2018
  • Registration Deadline: April 20th, 2018 - REGISTER!
  • Travel Info

Tentative agenda for the meeting is as follows:

Day 1: Pre-meeting FIB Tutorials (Optional, limited to 45 attendees)

  • Tutorial topics include:
      -Introduction to FIB instrumentation
      -Ion-solid interactions
      -Sample preparation Dos & Don’ts
      -2D & 3D analysis
  • Evening reception

Day 2: 11th annual FIB SEM Meeting

  • User and vendor presentations
  • Poster session
  • Evening social in Niagara-on-the-Lake area (Transportation will be provided)

Day 3: 11th annual FIB SEM Meeting

  • User and vendor presentations
  • Demos



Nabil Bassim,
Ken Livi,
Keana Scott,
Samantha Stambula,

2018 Logos