2017 UGM Agenda

March 2nd, 2017

National Institute of Standards and Technology
Gaithersburg, MD

Thursday, March 2nd, 2017
7:30 AM Breakfast & Sign-in
Morning Session (Green Auditorium)
8:45 AM Mike Fasolka
Acting Director, Material Measurement Laboratory, NIST
9:00 AM Brandon Van Leer
Thermo Fisher Scientific
Advanced S/TEM Sample Preparation Using Xe+ PFIB (Abstract)
9:15 AM Adam V. Steele1, Andrew Schwarzkopf1, Jabez J. McClelland2, Brenton Knuffman1
1 ZeroK NanoTech, 2 CNST/NIST
New Ion Source for Focused Ion Beam Applications (Abstract)
9:30 AM Ed Principe1, David Weaver2, Robert Chivas3, Michael DiBattista3, Scott Silverman3
1 TESCAN USA, Incorporated, 2 SRI International, 3 Varioscale Incorporated
Plasma FIB Deprocessing of Integrated Circuits from the Backside (Abstract)
9:45 AM Lucille Giannuzzi
Optimizing Van der Waals Forces for Micromanipulation of FIB Lift Outs (Abstract)
10:00 AM Tobias Volkenandt1, Fabián Pérez-Willard1, Michael Rauscher1, Pascal Maria Anger2
1 Carl Zeiss Microscopy GmbH, 2 Carl Zeiss Microscopy, LLC
The Smart Way of Sample Preparation (Abstract)
10:15 AM COFFEE BREAK (Lecture Room B)
10:45 AM Nicolas Piche1, Isabelle Bouchard1, Mike Marsh2
1 Object Research Systems, Montreal, Canada, 2 Object Research Systems, Denver, CO, USA
SegmentationTrainer - A Robust and User-Friendly Machine Learning Image Segmentation Solution (Abstract, Slides)
11:00 AM Doug Wei1, Chuong Huynh1, Stephen Kraemer2
1 Carl Zeiss Microscopy, LLC, 2 Harvard University
3D Nanotomography using FIB/SEM and FIB/HIM – A Case Study with Porous Polymer Composite (Abstract)
11:15 AM Hongkyu Yoon1, Thomas Dewers1, Thomas Spirka2, Kerim Genc2
1 Sandia National Laboratories, 2 Synopsys Inc.
FIB-SEM imaging of carbonate rocks and digital rock physics (Abstract)
11:30 AM Trevor Lancon
Thermo Fisher Scientific
Pore Network Modeling to Explore Structure Interconnectivity (Abstract)

11:45 AM Kedar Narayan
Frederick National Labs, Frederick, MDNIH/NCI
3DEM of cells and tissue at Frederick National Lab (Abstract)
Lunch (Portrait Room)
12:00 PM Lunch
Poster Session (Lecture Room B)
1:00 PM Lisa H Chan1, John Mangum2, Brian Gorman2
1 Tescan USA Inc., 2 Colorado School of Mines

Studying Titanium Dioxide with Correlative Raman-FIB-FESEM Microscopy (Abstract)

Bradley T. De Gregorio, Jonathan P. Winterstein, Rhonda M. Stroud
U.S. Naval Research Laboratory

Multi-Detector Scanning for Interstellar Dust Impact Craters in Aluminum Foil (Abstract)

Ali Hadjikhani, Sina Shahbazmohamadi
CHASE Lab, University of Connecticut

An attempt to quantify an inexpensive method for making a protective layer (Abstract)

Catherine Henry1,3, Anupriya Aggarwal2, Stuart Turville2, Kedar Narayan3
1 National Cancer Institute, 2 The Kirby Institute, University of New South Wales, 3 Frederick National Labs, Frederick, MDNIH/NCI

Quantifying the Location and Frequency of Viral Budding on HIV-Infected Dendritic Cells using CLEM/FIB-SEM (Abstract)

Daniel Goran1, Ted Juzwak2
1 Bruker Nano GmbH, 2 Bruker Nano Analytics

Advanced 3D EBSD data postprocessing for crystal plasticity analysis (Abstract)

Alex Krechmer, Alexander Sorkin, Chris Pawlowicz

Circuit Tracing on Integrated Circuit Using FIB Passive Voltage Contrast Effect (Abstract)

William McGehee, Thomas Michels, Vladimir Aksyuk, Jabez McClelland
Center for Nanoscale Science and Technology, NIST

Measurement of Ion Damage and Damage Relaxation in Silicon Microdisk Cavities using a Lithium Focused Ion Beam (Abstract)

V. Ray1, G. Li2, S. Samsonau2, E. Chang3
1 Particle Beam Systems & Technology, 2 Princeton International School of Mathematics and Science, 3 University of Maryland

Automating Reconstruction of Focused Ion Beam Current Density Distribution (Abstract, Poster)

R. Kirmse, A. Schertel, E. Hummel, P. Anger
Carl Zeiss Microscopy GmbH

Volume Imaging of Cellular Ultrastructure in Vitrified Biological Samples using Cryo FIB/SEM and Light Microscopy (Abstract)

Thomas Spirka1, Miki Miyazaki2, Kerim Genc1, Ross Cotton1, Philippe Young1
1 Synopsys Inc., 2 JSOL Corporation

Image Based Meshing for the Creation of Finite Element Models of Microstructure from FIB SEM Data (Abstract)

M.J. Zachman1, Z. Tu2, L.A. Archer2,3, L.F. Kourkoutis1,4
1 School of Applied and Engineering Physics, Cornell University, 2 Department of Materials Science and Engineering, Cornell University,3 School of Chemical and Biomolecular Engineering, Cornell University, 4 Kavli Institute at Cornell for Nanoscale Science, Cornell University

Nanoscale Structure and Bonding at Intact Solid-Liquid Interfaces Revealed by Cryo-FIB Lift-Out and Analytical Cryo-STEM (Abstract)

Afternoon Session (Green Auditorium)
2:30 PM Andrew J. Smith1, Andreas Rummel1, Miroslava Schaffer2, Stephan Kleindiek1
1 Kleindiek Nanotechnik, 2 Max Planck Institute of Biochemistry
Using a cryo-compatible Microgripper for cryo TEM Sample Liftout (Abstract, Slides)
2:45 PM Jiri Dluhoš1, Marco Sebastiani2, Tan Sui3, Enrico Salvati3, Christoph Schmid4, Alexander M. Korsunsky3
1 TESCAN Brno, s.r.o., 2 Roma Tré University, 3 University of Oxford, 4 TU Darmstadt
FIB-SEM Based Techniques for Residual Stress Evaluation at the Micro and Nanoscale (Abstract)

3:00 PM Sz-Chian Liou1, Chuan-Fu Lin2, Wen-An Chiou1, Gary Rubloff1,2
1 AIM Lab, Nano Center, University of Maryland, 2 Dept. of Materials Science and Eng., University of Maryland
Application of ToF-SIMS and STEM-EELS in the Study of Rechargeable Battery (Abstract)
3:15 PM Ali Hadjikhani, Sina Shahbazmohamadi
CHASE Lab, University of Connecticut
Circuit Tracing on Integrated Circuit Using FIB Passive Voltage Contrast Effect (Abstract, Slides)
3:30 PM COFFEE BREAK (Lecture Room B)
4:00 PM Steven B. Herschbein, Carmelo F. Scrudato, George K. Worth, Edward S. Hermann, Raymond L. Wagner
Exploring the Perceived Limits of Gallium-based Focused Ion Beam (FIB) Chip Circuit Editing (Abstract)
4:15 PM Jamil J. Clarke
Hitachi High Technologies America, Inc.
Auto Micro-Sampling: Development of the Next Generation [Automated] Software for FIB (Abstract)
4:30 PM Tara Nylese, Jens Rafaelsen
High Speed EDS Data Output with Quality Performance Metrics (Abstract)
4:45 PM V. Ray1, J. Taillon2, L. S. Riba2
1Particle Beam Systems & Technology, 2 University of Maryland
Quantifiable Comparative Testing Approach for Evaluating FIB/SEM Instruments (Abstract, Slides)
5:00PM D. Elswick, Y. Wang, C. Spence, S. Coyle, M. Hassel Shearer
Gatan, Inc.
Pico-Second Laser Tool for Producing TEM Lamella Larger Area & Enhanced FIB Productivity (Abstract, Slides)
5:15 PM Wrap-up
5:30 PM Happy Hour at the Growler’s Brew Pub, Gaithersburg, MD

Nabil Bassim, McMaster University
Kenneth Livi
, Johns Hopkins University
Keana Scott
, National Institute of Standards and Technology



Sustaining Sponsors


Platinum Sponsors

zeisshitachiangstromkleindiekbrukeredax   applied-beamstescanraithoxfordEXpressLOORSsynopsys appliedbeams

Gold Sponsors

gatan    zeroK