2013 UGM Agenda
March 1, 2013
Sheraton Commaner Hotel & Harvard University
Cambridge, MA
Sheraton Commaner Hotel & Harvard University
Cambridge, MA
| Friday, March 1st, 2013 | |
| 7:30 AM | Breakfast & Coffee |
| 8:30 AM | Welcome |
| 8:35 AM | Tribute to Oliver Wells (Slides) by Lynne Gignac, IBM TJ Watson Research Center |
| Morning |
|
| 8:45 AM | Yu Zhu*, Nicholas Antoniou**, Jemima Gonsalves* & David Mitzi* *IBM TJ Watson Research Center, **Harvard University Cryo-FIB TEM Sample Preparation for Cu2ZnSn(S,Se)4 Solar Cell (Abstract) |
| 9:00 AM | Cheryl Hartfield* & Nicholas Antoniou** *Oxford Instruments, **Harvard University Progress towards Cryo FIB Lift-Out (Abstract, Slides) |
| 9:15 AM | Solomon Boakye-Yiadom & Nabil Bassim University of Manitoba Use of FIB to Study the Impact Properties of Materials (Abstract) |
| 9:30 AM | Matthew I. Hartshorne*, Dieter Isheim**, David N. Seidman** & Mitra L. Taheri* *Drexel University, **Northwestern University Atom Probe Tomography: A Novel Double-Liftout Method for Site-Specific Preparation of Specimens for Correlating TEM and APT in Fine Grained Materials (Abstract) |
| 9:45 AM | A.J. Smith*, G. Renka*, K. Schock*, A. Lieb**, M. Dadras*** & S. Kleindiek* *Kleindiek Nanotechnik GmbH, ** Nanosurf AG, ***Centre Suisse d'Electronique et de Microtechnique Adding 3D Surface Imaging to Your FIB/SEM (Abstract, Slides) |
| 10:00 AM | COFFEE BREAK |
| 10:30 AM | Aaron Kuan Harvard University FIB-SEM Techniques for Solid-State Nanopore Characterization (Abstract) |
| 10:45 AM | J. Klingfus*, A. Nadzeyka**, S. Bauerdick**, T. Albrecht*** & J.B. Edel*** *Raith USA, **Raith GmbH, ***Imperial College London Wafer-scale Ion Beam Lithography of Nanopore Devices (Abstract) |
| 11:00 AM | H. Wu*, L.A. Stern*, K. Klein*, D. Xia*, D. Ferranti*, B. Thompson*, P.D. Rack** & C.M. Gonzalez** *Carl Zeiss NTS, **University of Tennessee Fabrication of 10 nm Metal Lines with Low Resistivity by Helium Ion Beam Induced Deposition (Abstract) |
| 11:15 AM | Michael W. Phaneuf Fibics Inc. Enabling Next-Generation Focused Ion Beam Applications Through Advanced Beam Control (Abstract) |
| 11:30 AM | Brandon Van Leer & Laurent Roussel FEI Company Fast Prototyping of Functional Devices Using a DualBeam (Abstract) |
| Lunch & Harvard-CNS Lab Tour |
|
| 12:00 PM | Lunch |
| 12:45 PM | Optional Harvard-CNS Lab Tour (~1hr) |
| Poster Session |
|
| 1:00 PM | Soeren Eyhusen & Roland Salzer, Carl Zeiss Microscopy Expanding the range of the FIB: From rapid material removal to ultra-thin TEM lamella preparation (Abstract) Lucille A. Giannuzzi, L.A. Giannuzzi & Associates LLC EXpressLO™ for High Throughput Lift-Out (Abstract) Zachary D. Harms, Daniel G. Haywood & Stephen C. Jacobson, Indiana University Fabrication of In-Plane Nanofluidic Devices in Glass Substrates by Flood Gun Assisted FIB Milling (Abstract) Gavin Murphy, Indiana University Indiana University's state-of-the-art FIB-SEM S.D. Sitzman & C.T. Chou, Oxford Instruments America Method for Grain Boundary Triple Junction Analysis by 3D EBSD (Abstract) Anna Weber, Rahul Thakar, Celeste Morris, Kirstin Morton, Chiao-Chen Chen & Lane A. Baker, Indiana University Focused Ion Beam Milling of Nano Scale Probes for Scanned Probe Microscopy (Abstract) Richard G. White, Tim S. Nunney, Paul Mack & Brian R. Strohmeier, Thermo Fisher Scientific Advanced Depth Profiling Characterization of Mixed Organic/Inorganic Multipayer Devices Using X-Ray Photoelectron Spectroscopy (XPS) and a Combined Monatomic and Gas Cluster Argon Ion Source (Abstract) Efrat Moyal & Janet Teshima, Lattice Gear LLC. New, Innovative Method for Accurate Cleaving of Samples with Single Crystal Substrate (Abstract) George Wetzel* & Jamil Clarke**, *Clemson University, **Hitachi High Technologies America Three-Dimensional Microanalysis of Advanced Materials Using FIB-SEM Instrumentation (Abstract) |
| Afternoon |
|
| 2:30 PM | Leonidas E. Ocola Argonne National Laboratory Advances in Ion Beam Micromachining for Complex 3D Microfluidics (Abstract) |
| 2:45 PM | Carl Kamp, Alexander Sappok & Victor Wong Massachusetts Institute of Technology Investigations of Automotive Aftertreatment Component Aging by Focused Ion Beam (FIB) Milling: the Catalyst-Substrate Interface and Intra-and Inter-Layer Interactions (Abstract) |
| 3:00 PM | William J. Rice New York Structural Biology Center Overview of projects collected on the Helios FIB/SEM at the NYSBC (Abstract) |
| 3:15 PM | Kedar Narayan National Institutes of Health Simultaneous Correlative 3D Imaging of Nanoscale Targets and Entire Cells by Focused Ion Beam Scanning Electron Microscopy (Abstract) |
| 3:30 PM | COFFEE BREAK |
| 3:50 PM | Luiz F.G. Morales & Richard Wirth German Research Centre for Geosciences Potsdam Applications of FIB Coupled with SEM and TEM in Geological Materials (Abstract) |
| 4:05 PM | Shawn Zhang Visualization Sciences Group Advanced Processing and Modeling Methods for Porous Material FIB-SEM Data (Abstract) |
| 4:20 PM | E.L. Principe Tescan FERA Plasma Ion Source Workstation: Applications and Possibilities (Abstract) |
| 4:35 PM | John Notte Carl Zeiss The Gas Field Ion Source: Extension to Species Beyond Helium (Abstract) |
| 4:50 PM | Wrap-up & Optional Harvard-CNS Lab Tour |
| 5:30 PM | Happy Hour at the John Harvard's Brewery & Ale House |
Organizers
Nicholas Antoniou, Harvard University
Nabil Bassim, U.S. Naval Research Laboratory
Ken Livi, Johns Hopkins University
Konrad Rykaczewski, Massachusetts Institute of Technology
Keana Scott, National Institute of Standards and Technology
Sponsors
Sustaining Sponsors
Platinum Sponsors
