|List of FIB and FIB SEM instruments, accessories, availability, and contact information in the 'greater' DC area.
To access the full list, click here. You can also jump to the list of instruments at a specific institution by clicking on one of the links below.
If your instrument is not on the list and you would like to have it included, please contact us.
FIB SEM Users Mailing List
Join our new FIB SEM Users mailing list and stay connected with the FIB community!
Thursday, March 2nd, 2017
National Institute of Standards and Technology (NIST)
The 2017 FIB SEM Workshop will be held at the Gaithersburg campus of the National Institute of Standards and Technology (NIST). We will have a full day of presentations and posters by FIB users and vendors highlighting interesting new FIB applications and the latest technology. And, as always, there will be plenty of opportunities for informal discussion of new techniques and applications as well as getting (re)connected with your fellow FIBers.
Abstract submissions are required for all presenters (user & vendor contributions). If you would like to present a paper or poster, please submit an abstract to the organizers. All FIB related topics such as new and novel application areas for FIB, advances in FIB and FIB related instrumentation and techniques, image and data processing techniques for FIB data are welcome.
- Registration Deadline: February 23rd, 2017 - Register!
Because NIST is a controlled-access facility, you must pre-register to attend.
- Travel Info
Please check our website (www.fibsem.net) for additional information about the meeting. There is no fee to attend the meeting, and breakfast and lunch will be provided! There will be a Happy Hour following the meeting, so don’t forget to click Yes to Happy Hour at the Growler’s Brew Pub when you register.
Remember, you don't have to be a local user to attend! We look forward to seeing you at NIST!
For more information about the FIB SEM meetings, please contact the organizers or check out our Meetings page for previous years' programs.
Other FIB Events
- 3D EDS/EBSD Workshop at University of Maryland
8 AM - 11 AM, March 1, 2017
Room 2460, A.V. Williams Building
University of Maryland, College Park, MD
The workshop will cover milling with both gallium focused ion beam microscope (Ga FIB) and plasma focused ion beam (PFIB) microscope. The use of energy dispersive spectroscopy (EDS) and electron backscattered diffraction (EBSD) will be discussed and demonstrated for 3D volume mapping, imaging and reconstruction.
Space is limited, so please RSVP to firstname.lastname@example.org
- Lehigh Microscopy School
June 4 – 9, 2017
Lehigh University, Bethlehem, PA
- Microscopy and Microanalysis 2017
August 6 - 10, 2017
America's Center Convention Complex, St. Louis, Missouri
- European FIB Users Group Meeting (EFUG 2017)
At the ESREF 2017, September 25 - 27, 2017