Thursday, March 2nd, 2017
National Institute of Standards and Technology (NIST)
The 2017 FIB SEM Workshop will be held at the Gaithersburg campus of the National Institute of Standards and Technology (NIST). We will have a full day of presentations and posters by FIB users and vendors highlighting interesting new FIB applications and the latest technology. And, as always, there will be plenty of opportunities for informal discussion of new techniques and applications as well as getting (re)connected with your fellow FIBers.
Abstract submissions are required for all presenters (user & vendor contributions). If you would like to present a paper or poster, please submit an abstract to the organizers. All FIB related topics such as new and novel application areas for FIB, advances in FIB and FIB related instrumentation and techniques, image and data processing techniques for FIB data are welcome.
- Abstract Submission Deadline: February 3rd, 2017
Abstracts should be 250 words or less in length. Email abstracts to firstname.lastname@example.org.
Abstract Notification: February 17th, 2017.
- Registration Deadline: February 23rd, 2017 - Register!
Because NIST is a controlled-access facility, you must pre-register to attend.
- Travel Info
Please check our website (www.fibsem.net) for additional information about the meeting. There is no fee to attend the meeting, and breakfast and lunch will be provided! There will be a Happy Hour following the meeting, so don’t forget to click Yes to Happy Hour when you register.
Remember, you don't have to be a local user to attend! We look forward to seeing you at NIST!
For more information about the FIB SEM meetings, please contact the organizers or check out our Meetings page for previous years' programs.